Commit message (Collapse) | Author | Age | Files | Lines | |
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* | 1-Wire. Duplicated code from testhal apllications moved to separate directory. | barthess | 2016-10-18 | 1 | -257/+0 |
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* | 1-wire. Data acqusition code in test application rewritten in more safe way | barthess | 2016-05-30 | 1 | -3/+3 |
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* | Updated some testhal projects to new ChibiOS code | barthess | 2016-03-15 | 1 | -3/+3 |
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* | 1-wire driver improvements. | barthess | 2016-01-24 | 1 | -14/+36 |
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* | [1-wire] Cosmetical cleanups | barthess | 2014-12-27 | 1 | -33/+46 |
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* | 1-wire. STM32F1xx code tested | barthess | 2014-12-18 | 1 | -15/+12 |
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* | 1-wire. Added workaround form F1xx MCUs | barthess | 2014-12-14 | 1 | -2/+2 |
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* | 1-wire. Added testhal for STM32F1xx. Not tested in hardware | barthess | 2014-12-08 | 1 | -0/+225 |