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| author | Anastasia Klimchuk <aklm@chromium.org> | 2022-07-20 15:24:51 +1000 |
|---|---|---|
| committer | Anastasia Klimchuk <aklm@chromium.org> | 2022-08-08 03:14:58 +0000 |
| commit | 47541722c16a59fcc574397d5413ddc1b4a11cde (patch) | |
| tree | f44df1131b226cbda1a4a62fb48013245944ac7b /tests/tests.h | |
| parent | 36299dbab2397f25c4009339018065dc79d77452 (diff) | |
| download | flashrom-47541722c16a59fcc574397d5413ddc1b4a11cde.tar.gz flashrom-47541722c16a59fcc574397d5413ddc1b4a11cde.tar.bz2 flashrom-47541722c16a59fcc574397d5413ddc1b4a11cde.zip | |
tests: Add basic lifecycle test for parade_lspcon
This unit test does not require any additional mocks because init
and shutdown of i2c infra was covered in realtek programmer lifecycle.
Default mocking of i2c is sufficient to run a basic lifecycle.
To run the test, config option for the programmer needs to be
enabled explicitly, since by default this programmer is disabled.
BUG=b:238816889
TEST=meson configure -Dconfig_parade_lspcon=true
ninja test
Change-Id: I0dcfae4a58c64b2e8d56ec51b4b050534cbb4cd2
Signed-off-by: Anastasia Klimchuk <aklm@chromium.org>
Reviewed-on: https://review.coreboot.org/c/flashrom/+/66003
Reviewed-by: Edward O'Callaghan <quasisec@chromium.org>
Reviewed-by: Felix Singer <felixsinger@posteo.net>
Reviewed-by: Thomas Heijligen <src@posteo.de>
Tested-by: build bot (Jenkins) <no-reply@coreboot.org>
Diffstat (limited to 'tests/tests.h')
| -rw-r--r-- | tests/tests.h | 1 |
1 files changed, 1 insertions, 0 deletions
diff --git a/tests/tests.h b/tests/tests.h index 240f33db..c84179c3 100644 --- a/tests/tests.h +++ b/tests/tests.h @@ -50,6 +50,7 @@ void raiden_debug_basic_lifecycle_test_success(void **state); void dediprog_basic_lifecycle_test_success(void **state); void linux_mtd_probe_lifecycle_test_success(void **state); void linux_spi_probe_lifecycle_test_success(void **state); +void parade_lspcon_basic_lifecycle_test_success(void **state); void realtek_mst_basic_lifecycle_test_success(void **state); /* layout.c */ |