blob: 41c430e8c57a2a97140211eb7e9d2f4cbd7cb86c (
plain)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
|
LIBRARY ieee;
USE ieee.std_logic_1164.ALL;
PACKAGE test_ctrl_parameter_pkg IS
TYPE device_t IS (
DEVICE_NONAME,
DEVICE_TEST
);
-----------------------------------------------------------------------------
-- DDR SDRAM device definitions
-----------------------------------------------------------------------------
TYPE mem_device_t IS (
TEST_1,
TEST_2,
TEST_3
);
TYPE mem_device_array_t IS ARRAY (natural RANGE <>) OF mem_device_t;
CONSTANT C_TEST_BUS_ARRAY_SIZE : natural := 10;
SUBTYPE test_device_type_t IS
mem_device_array_t(0 TO C_TEST_BUS_ARRAY_SIZE - 1);
CONSTANT DEFAULT_TEST_DEVICE_TYPE_ARRAY : test_device_type_t :=
(OTHERS => TEST_1);
TYPE device_test_parameters_t IS RECORD
test_devices : test_device_type_t;
END RECORD;
CONSTANT DEFAULT_DEVICE_TEST_PARAMETERS :
device_test_parameters_t := (
test_devices => DEFAULT_TEST_DEVICE_TYPE_ARRAY);
TYPE device_test_parameters_array_t IS ARRAY (natural RANGE <>) OF
device_test_parameters_t;
SUBTYPE constrained_device_test_parameters_array_t IS
device_test_parameters_array_t(0 TO device_t'pos(device_t'high));
CONSTANT DEVICE_TEST_PARAMETERS :
constrained_device_test_parameters_array_t := (
device_t'pos(DEVICE_TEST) =>
(
test_devices => (1 | 2 => TEST_1, 3 => TEST_2, OTHERS => TEST_3)
),
OTHERS => DEFAULT_DEVICE_TEST_PARAMETERS
);
END test_ctrl_parameter_pkg;
ENTITY test IS
END ENTITY test;
ARCHITECTURE rtl OF test IS
BEGIN
END ARCHITECTURE rtl;
|
